C H A P T E R 8 |
Color Graphics Frame Buffer Test (cg14test) |
cg14test
checks the
cg14
frame buffer card.
cg14test
is specific to the
VSIMM (Video SIMM) devices in the
SPARCstation 10 SX and the SPARCstation
20 SX.
Caution - Do not close the SunVTS window to an icon while it is running frame buffer tests. |
Ensure that the frame buffer locking option is enabled from the Options window.
For full instructions on testing frame buffers, see Testing Frame Buffers .
There are nine test groups in cg14test :
MDI and VBC Chip Control Registers
Memory Chips
MDI Chip Cursor Registers
MDI Chip CLUT Registers
DAC Chip Registers
MDI Chip XLU Registers
CG14 Display (visual only)
MDI Chip Testmode Readback in 8-bit mode
Driver IOCTLs
These test groups are tested by opening /dev/fbs/cgfourteenX , mapping the MDI Control Address Space, modifying the target test location (using direct writes to the mapped address space), reading from the mmapped address space for verification, and closing the device. |
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This subtest loads a visual pattern of 256 colors, then rotates the pattern around. You verify this test by seeing it display. |
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This test group is tested by loading the frame buffer (FB) memory with four neutral data patterns, then setting a target FB pixel with data that triggers the test mode readback latch. The result is read from the readback register after vertical blanking occurs. Two different trigger patterns are used at each FB pixel. All four MDI pixel paths (A - D) are used, and the pixel locations for each trigger are designed to detect gross MDI input data opens or short, VRAM SAM addressing, and VRAM-to-SAM transfer addressing. The screen shows four horizontal bars, which are either greyscale or colored. These bars change each time the trigger data is inverted, and as it completes the testing of a raster pattern. Note: If the resolution and VRAM size permits, 8-bits per pixel mode are tested. |
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Test all IOCTL calls that have not yet been used to verify proper driver communication to the hardware. Call the driver to perform a hardware update, and then confirm that the update was successful by using the complementary driver read, or reading the mmap'ed address space and comparing it against the stimulus. cg14test performs the appropriate steps before and after each test (if possible) to maintain context and prevent visual confusion by saving the register data before it is overwritten, disabling video (if possible), performing the specific test, and restoring the saved register data information. The data used for register testing is optimized to include all 0's, all 1's, and walking a 1 through each bit being tested. |
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The Memory Chips test group includes VRAM Testing, Memory Retention, and Test Write Recovery. The Data Bus test uses 18 NTA patterns (Nair, Thatte, and Abraham's testing procedure for RAM) to check for data and address faults. This test is performed in MDI_CHUNKY_XBGR_MAP access mode only. See TABLE 8-2 . |
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The test ascends through the frame buffer memory, clearing it to 0's. The NTA pattern test number x reads a location to make sure test data y is present. It then writes new data z to that location. The location ascends through the FB sequentially. See TABLE 8-2 . The VRAM Data Retention test checks for gross problems with the VRAM refresh. Since refresh is active during this test, no retention problems should occur unless the refresh is defective. This test turns off the video, writes 0's to all the VRAM, waits the specified memory_hold time (the default is five seconds), then reads and compares all VRAM data. This process is repeated with data of f's, then the video is restored and the test is complete. Two command-line parameters are related to this test: R= number and H= number . R= lets the user specify the refresh interval from 128-1023. The time between refresh cycles and the system default is 123. H= lets the user specify the retention test hold time in seconds. A Write Recovery test is used in all the EMC mapping modes to write data to 0's followed by immediately reading that data location to see if the VRAM can recover from a write correctly. This is done to all sequential ascending locations. Next, a second independent pass of memory is made with the complementary data of 0xffffffff written to descending locations of the FB memory buffer. |
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The MDI Chip Cursor Registers are:
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The MDI Chip CLUT Registers are:
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The DAC Chip Registers test group includes the RAMDAC registers and control registers. |
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This test visually displays 256 boxes on the screen (each in a different color), and then shifts the CLUT1 entries giving the visual impression of the pattern mirroring itself from left to right horizontally. The pattern then rotates up, down, followed by mirroring itself horizontally left to right. |
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This test mode reads back register bits 23-0 in read-only and verify modes. |
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To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system may not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.
See Testing Frame Buffers for details. |
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When enabled, the color bar screen(s) in the MDI Testmode Readback test checks all SAM transfers in clock=0 mode and clock=1 mode. If Long test is disabled, clock=1 runs checks on the first eight addresses and the first SAM transfer only. |
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For multiprocessor systems, indicates the processor to be tested. |
Due to the nature of graphic tests, reading from or writing to the frame buffer during graphic tests will disturb user operation. This test is only available in offline Functional test mode.
This mode uses all subtests to test the cg14 frame buffer. The user can select the long mode for TRMB subtest. |
/opt/SUNWvts/bin/cg14test standard_arguments -o dev= device_name , lock= E(nable)/D(isable) ,L,I
Specifies the path of the cg14 device file to be tested;
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Enables and disables the window system locking option. See Testing Frame Buffers for details. Do not use when your device is the window system display. |
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Enables optional driver ioctl tests for cursor.
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Note Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to 32-Bit and 64-Bit Tests. |
Copyright © 2002, Sun Microsystems, Inc. All rights reserved.