C H A P T E R

C H A P T E R 47

Smart Card Test(sctest)

The Smart Card test ( sctest ) consists of a series of subtests to exercise smart cards and smart card readers. It exercises the Java ^TM card terminal reader driver, the Solaris I2C SCM device driver, and the serial device driver.

sctest tests only the internal SC reader. sctest is only run as an intervention test. Users need to initalize SC card and Internal SC reader to run sctest .

Note - Users should initialize the smart card with commands or GUI provided by OS. This initialization information can be found in the Smart Card User Administration Guide at docs.sun.com.

Caution - Do not use a smart card with real data for sctest. Allocate a scratch smart card for testing purposes only. Functions of sctest will delete any existing data on the card.

Note - Do not run sctest and sptest at the same time. Test results will conflict if sptest is enabled when sctest is run. (Because it is an intervention test, sptest is disabled by default.)

To select sctest , click the Intervention button in the Select Devices panel.

sctest Test Requirements

The following five requirements must be met before running sctest :

You must enable the SunVTS intervention mode.
You must have a scratch smart card ready.
You must configure the card reader, if it has not been configured already. The card reader can be configured with the GUI provided by the OS (under Workspace Menu-Tools-Smart card).
You must initialize the test card with GUI provided by the OS (under Workspace Menu-Tools-Smart card).

You must run the following command to personalize the card:

# /usr/bin/smartcard -c init -A A000000062030400 -P `$$$$java' \

user=guest application=AAA password=guestwho

Once you have fulfilled these five requirements, you are ready to run sctest .

sctest Subtests

TABLE 47-1 `sctest` Subtests
Subtest	Description
Card Presence Detect test	Checks whether a card is present in the reader. Place the card in the reader to begin the test.
Card Lock/Unlock test	Exercises the functions that lock and unlock a card. Place the card in the reader to begin the test.
Insertion/Removal test	Tests detection of card insertion and removal. If the card is already in the reader, remove and reinsert when prompted. This test is disabled by default, since it requires user intervention.
PinCardService test	Waits for a card to be inserted, then performs authentication of the default PIN ( `$$$$java` ). Note: this subtest assumes the card has been initialized.
Simple Authentication test	Waits for a card to be inserted, then performs authentication of the default PIN ( `$$$$java` ). Displays the username and password of an example user called `AAA` . This test only works for cards that have been initialized. This subtest requires the PinCardService test to first validate the PIN on the smart card.
UserInfoCardService test	Waits for a card to be inserted, then performs authentication of the default PIN ( `$$$$java` ). Displays the user information such as the username and password of example user called `AAA` . If Write mode is enabled, the test will also create default user information for an example user `BBB` . If Verbose mode is enabled, this user information will be displayed. Next, the test deletes the user information for `BBB` . When the test queries for user information for `BBB` , it expects an exception (since this information is already deleted). This subtest requires that the PinCardService test has validated the PIN on the smart card.

sctest Options

To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system may not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.

FIGURE 47-1 sctest Test Parameter Options Dialog Box

TABLE 47-2 `sctest` Options
`sctest` Options	Description
Mode	Enables or disables the Write mode for the UserInfoCard Service subtest.
OCF Based tests	Enables or disables all of the following subtests: Card Presence Detect, Card Lock/Unlock, Insertion/Removal, PinCardService, Simple Authentication, and UserInfoCard.
Card Removal test	Enables or disables the Insertion/Removal subtest.

sctest Test Modes

TABLE 47-3 `sctest` Test Modes
Test Mode	Supported?	Description
Connection	No	Not supported.
Functional (Offline)	Yes	Runs the full set of tests.

sctest Command-Line Syntax

TABLE 47-4 `sctest` Command-Line Syntax
Argument	Description
`dev=` a\|b\|i2cscmN	Names the type of device. The value `a` or `b` implies `ttya` or `ttyb` . `N` =0, 1, 2, and so on.
`Mode=` Enable \| Disable	Enables or disables the Write mode for the UserInfoCard Service subtest.
`OCFBasedTests=` Enable \| Disable	Enables or disables all of the following subtests: Card Presence Detect, Card Lock/Unlock, Insertion/Removal, PinCardService, Simple Authentication, and UserInfoCard.
`CardRemovalTest=` Enable \| Disable	Enables or disables the Insertion/Removal subtest.

Note Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to 32-Bit and 64-Bit Tests.