C H A P T E R

C H A P T E R 16

Sun StorEdge A5x00 Test (enatest)

enatest is used to provide configuration verification, fault isolation, and repair validation of the Sun StorEdge trademark A5x00 subsystem. The enatest tests Sun StorEdge models A5000 (14 slot disk array) and A5200 (22 slot disk array).

The Sun StorEdge A5x00 is a high availability mass storage subsystem consisting of:

SCSI Fibre Channel protocol host adapters with dual 100-Megabyte FC-AL ports.

A disk enclosure.

A front panel display for configuration information.

Up to two interface boards in the enclosure, which provide FC-AL connections to the enclosure and also provide status information and control of the conditions within the enclosure.

Other field-replaceable units (FRUs) within the enclosure include power supply units, fan trays, and backplane.

Note - Do not run enatest and socaltest at the same time, otherwise test failures might occur.

Note - The Sun StorEdge A5x00 was formally known as the Sun Enterprise Network Array trademark . The enatest tests both of these disk array subsystems.

enatest detects all Sun StorEdge A5x00 enclosures connected to the host and collects relevant configuration information. FIGURE 16-1 shows the Test Parameter Options menu which contains a sample configuration listing and test parameters. describes the extent of the test coverage and provides samples of the configuration information that is displayed.

TABLE 16-1 `enatest` Coverage
Test Coverage	Description
Host Connections	`enatest` searches for all the active and inactive connections between the host and the enclosure and reports the number of existing active connections. If the VERBOSE mode is enabled, the port on the host side and the GBIC port on the enclosure side is reported for each active connection. The test also diagnoses any inactive connection(s) and reports the possible causes for the failure. The test will fail if there are one or more inactive connections. See the section on enatest Fault Isolation Capability for more information.
`Sample Output, for an enclosure attached to an SBus socal card:` `SUNWvts.enatest.1010 06/05/97 13:48:53 enatest ses0 VERBOSE:` `"MYBOX: Lower-Right GBIC connected to host via /devices/sbus@1f,0/SUNW,socal@0,0:1"` `SUNWvts.enatest.1006 06/05/97 13:48:53 enatest ses0 VERBOSE:` `"MYBOX: Interface Board (Bottom one in the enclosure) detected to be installed` `and OK"` `SUNWvts.enatest.6023 06/05/97 13:48:53 enatest ses0` `ERROR: "MYBOX: Cannot communicate with the enclosure via` `/devices/sbus@1f,0/SUNW,socal@0,0:0; possibly connected to Lower-Left` `GBIC in the enclosure"` `Probable_Cause(s):` `(1)Signal too low at the GBIC module in the enclosure` `(2)Faulty cable or cable disconnected` `(3)Faulty GBIC module on the host side` `Recommended_Action(s):` `(1)Ensure the cables are properly connected` `(2)Please contact your service representative` `SUNWvts.enatest.2006 06/05/97 13:48:53 enatest ses0 INFO:` `"MYBOX: Number of connections to the host: 1"`
Disk Access	During the testing, each disk is accessed through each active connection leading to that disk. The `enatest` opens partition 2 on the disk and reads 512 bytes of raw data. If there are any failures, the test tries to isolate the fault to either an enclosure element, the cable, the host adapter card, or the OE module on the host adapter. See the section on enatest Fault Isolation Capability for more information.
Enclosure Status	The status of the enclosure is obtained by querying the SCSI Enclosure Services (SES) device in the enclosure. Detailed information regarding the status of the elements within the enclosure is reported. The test fails if a critical condition is detected in the enclosure. The table below shows how the status information is reported.

TABLE 16-2 Element Enclosure Status
Enclosure Element	Information
Disk	Fault Sensed--Yes/No Status of ports A and B--Connected or Bypassed
Power Supply	Status--ON/OFF Temperature--OK/Critical Overtemp/Abnormal AC Input--OK/Not OK DC Output--OK/Not OK
Fan	Status--On/Off Speed--High/Low/Stopped
Backplane	Status--OK/Failed Status of ports A and B--Connected/Bypassed
Interface Board	Temperature--OK/Critical Overtemp Loop A status--OK/Failed Loop B status--OK/Failed
GBIC	Status--Disabled/Enabled Signal Level--OK/Too low Transmitter--OK/Failed

enatest Options

To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system may not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.

FIGURE 16-1 enatest Test Parameter Options Dialog Box

TABLE 16-3 `enatest` Options
`enatest` Options	Description
Enclosure Services Functional test (general description)	Certain control operations are performed on devices in the enclosure through the SES device and verified that the operation was performed successful. This functional test involves the following steps: Perform control operation. Verify control operation was successful. Restore state to what it was before 1. Verify restore operation was successful. The test will fail if any one of the above steps fails. This test targets the disks and the fans in the enclosure.
Enclosure Services Functional test (detailed Disk test description)	Control Operation--Each port of the disk is toggled from its original state. A port that was originally connected will be bypassed and vice-versa. Verify Control Operation--This is done in two ways. First, the new status of the disk ports is verified by reading the status through the SES device. The test will fail if the status read back does not reflect the change. Next, disk access is attempted through the port that was originally connected but has now been bypassed. The test will fail if the access attempt is successful. Restore State--The port states are restored to what they were before the Control Operation. Verify Restore Operation--This is done in two ways. First the status of the disk ports is verified by reading the status through the SES device. The test will fail if the status read back does not reflect the change. Next, disk access is attempted through the port that have been reconnected. The test will fail if the access attempt is unsuccessful.
Enclosure Services Functional test (detailed Fan test description)	Control Operation--The speed of each fan is toggled. Possible speeds are HIGH and LOW. Verify Control Operation--The status is read back through the SES device and the speeds are compared. Failure to vary the speed in this case will result in an INFO message indicating that the fan speed could not be changed but does not result in a test failure. This is because SES can ignore fan speed change requests if required because of existing ambient temperature conditions. Restore State--Restore the fan speed to the original speed. Verify Restore Operation--This is similar to the Verify Control Operation step above.

enatest Fault Isolation Capability

In the case of a failure, the test aids in fault isolation by reporting the possible cause(s) of failure. The fault isolation capability varies depending on the nature of the fault and the system configuration. enatest can detect and isolate hard faults. The following table shows the fault isolation capability for different configurations. A Yes indicates that fault isolation capability is available for that component in that configuration and a No indicates lack of fault isolation capability for that component in that configuration.

The following table is not applicable when using the PCI-based Fibre Channel card due to the card's lack of fault isolation capabilities.

TABLE 16-4 `enatest` Fault Isolation Configurations
Connections to Enclosure	System Architecture	SOC+ Host Adapter	Host Side GBIC or Cable	Enclosure Elements
Connections to Enclosure	System Architecture	SOC+ Host Adapter	Host Side GBIC or Cable	Disk	Backplane	IB	GBIC
Multiple	sun4u	Yes	Yes	Yes	Yes	Yes	Yes
Multiple	sun4d	Yes	No	Yes	Yes	No	No
Single	sun4u	Yes	No	No	No	No	No
Single	sun4d	Yes	No	No	No	No	No

enatest Test Modes

TABLE 16-5 `enatest` Test Modes
Test Mode	Supported?	Description
Connection test	Yes	In this mode, the host connections and the status of the enclosure are checked. The test fails if there are any broken connections or if a critical enclosure condition is detected. Noncritical conditions result in a warning. A sample of the output follows.
`Connection test starting....` `ses0` `Status: Connected` `Enclosure:` `Product Anemones Enterprise Network Array,` `Enclosure Name=MYBOX,` `Host Connections:` `Number of Active Connections=2,` `Enclosure State:` `Critical Conditions=None, Non-Critical Conditions=None` `Connection test complete`
Functional (offline)	Yes	All test options are allowed in this mode.

enatest Command-Line Syntax

/opt/SUNWvts/bin/enatest standard_arguments -o dev= device_name , disk_access= enable|disable ,disks= disk1:disk2:disk3:...diskn ,disp= enable|disable, esfunc= enable|disable ,conn= enable|disable ,delay= delay_in_seconds

TABLE 16-6 `enatest` Command-Line Syntax
Argument	Description
`dev=` device_name	Specifies the name of an `ses` device in the enclosure.
`disk_access=` enable\|disable	Enables or disables disk access.
`disks=` disk1:disk2:disk3:... diskn	Lists the disks contained in this enclosure that the `disk_access` test should attempt to access. The disk names are separated by colons (:). If this option is disabled, the test will access all disks found in the enclosure.
`disp=` enable\|disable	Enables or disables the display of detailed status information regarding the enclosure elements.
`esfunc=` enable\|disable	Enables or disables the Enclosure Services Functional test.
`conn=` enable\|disable	Displays information about the connection to the host.
`delay=` delay_in_seconds	Sets the minimum delay (in seconds) between successive invocations of the test.

Note Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to 32-Bit and 64-Bit Tests.